Mr. Hyunmin Kim

Engineer
Samsung Electronics
Hwaseong-si, Gyeonggi-do
Korea, Republic of (South)

Papers:

AI Applications for Failure Analysis - A Novel Approach to Multivariate Time-series Anomaly Detection and Correlation analysis for In-fab Metrology Data
AI Applications for Failure Analysis - A Novel Approach to Multivariate Time-series Anomaly Detection and Correlation analysis for In-fab Metrology Data