Dr. C.Q. Chen

Deputy Director
Globalfoundries Singapore Pte Ltd.
Product, Test and Failure Analysis
Singapore, Singapore
Singapore 738406

Papers:

Nanoprobing EBIC Analysis to Locate Silicon Defects in CMOS Devices on SOI Wafers
Enabling Volume Electrical Fault Isolation Workflow with Automation to Enhance Throughput and Success Rate
Strategic Domain Isolation using FIB to Overcome Nanoprobing Constraints on Challenging Samples
Microscopy Analysis and Material Characterization - Unraveling the Ni Multi-Moon Issue: A Cross-Functional Approach to Expose and Analyze Subsurface Defects