Mr. Rik Otte

Physical failure analysis technical staff
NXP Semiconductor
Failure analysis
Nijmegen, Nijmegen
Netherlands

Papers:

Novel Die Edge Delayering Methodology with Early Defined Lap Stop at Non-Low K Dielectric Layer and Gas Assisted PFIB Delayering
Applications of Electron Energy Loss Near-Edge Structure Analysis for Defect Characterization in Advanced Semiconductor Devices