51st International Symposium for Testing and Failure Analysis (November 16-20, 2025)
November 16 - 20, 2025
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
N/A Josh Joy
Senior Engineer
Global Foundries
Essex Junction, VT
USA 05452
Papers:
Power Devices (Si, SiC, GaN) - Investigation of early photon emission (PEM) in GaN-on-Si HEMTs, part I