Microscopy - TEM Sample Prep

Sunday, November 16, 2025: 9:00 AM-10:00 AM
Ballroom A (Pasadena Convention Center)
Rosalinda Ring, NenoVision s. r. o., Dr. Pawel Nowakowski, E.A. Fischione Instruments, Inc. and Mr. Randy Mulder, Silicon Labs
9:00 AM
TEM sample preparation for electron microscopy characterization and failure analysis of advanced semiconductor devices
Dr. Cecile S. Bonifacio, Fischione Instruments
See more of: Tutorial
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