Microscopy - FIB Sample Prep

Sunday, November 16, 2025: 2:30 PM-3:30 PM
Ballroom A (Pasadena Convention Center)
Rosalinda Ring, NenoVision s. r. o., Dr. Pawel Nowakowski, E.A. Fischione Instruments, Inc. and Mr. Randy Mulder, Silicon Labs
2:30 PM
Advanced FIB/SEM Sample Preparation and Analysis Techniques
Dr. Sam Subramanian, NXP Semiconductors; Mr. Eric Yi, NXP Semiconductors
See more of: Tutorial
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