A Lumped-Element Circuit Model for Improved Spatial Localization of Open Defects in RF Lock-in Thermography (RF-LiT)

Wednesday, October 7, 2026: 9:20 AM
Lucas Lum , Advanced Micro Devices (Singapore) Pte Ltd, Singapore, Singapore
Bernice Zee , Advanced Micro Devices (Singapore) Pte Ltd, Singapore, Singapore
Wen Qiu , Advanced Micro Devices (Singapore) Pte Ltd, Singapore, Singapore
Kevin Bo Lin Tan , Advanced Micro Devices (Singapore) Pte Ltd, Singapore, Singapore
J.M. Chin , Advanced Micro Devices (Singapore) Pte Ltd, Singapore, Singapore

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