Root Cause Identification of Low Ohmic Shorts in Analog Circuitry and the Application of Thermo Dynamic Imaging

Wednesday, October 7, 2026: 8:20 AM
Mr. Sukho Lee , NXP Semiconductors, Austin, TX
Mr. Dan Bodoh , NXP Semiconductors, Austin, TX
Mr. Shimpei Tominaga , Hamamatsu Photonics K.K., Hamamatsu, Shizuoka, Japan
Mr. Akihito Uchikado , Hamamatsu Photonics K.K., Hamamatsu, Shizuoka, Japan
Dr. Keith Serrels , Hamamatsu Corporation, San Jose, CA

See more of: Die Level Fault Isolation I
See more of: Technical Program