DRAM Capacitor-Redistribution Layer Overlay Measurement Using Image Processing with Dimple-Grinder Sample Preparation

Wednesday, October 7, 2026: 7:20 PM
Exhibit Hall (Henry B. González Convention Center)
Dr. Jian-shing Luo , Micron Technology Taiwan, Taoyuan, Taoyuan City, Taiwan
Dr. Ashok Ranjan , Micron Technology, Taoyuan, Taoyuan, Taiwan

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