Analysis of Increasing Leakage in a MnO2 Cathode Tantalum Capacitor over Storage Time
Analysis of Increasing Leakage in a MnO2 Cathode Tantalum Capacitor over Storage Time
Tuesday, October 6, 2026: 1:10 PM
Summary:
This paper outlines the failure analysis of a MnO2 solid tantalum capacitor which exhibited anomalous electrical leakage in a time-based periodic study of nominal electrical characteristics following unbiased storage in a controlled environment. Physical analysis identified likely pre-existing self-repair sites and a high density of Ta2O5 crystalline oxide nodules as the likely causes of the observed anomalous electrical leakage.
This paper outlines the failure analysis of a MnO2 solid tantalum capacitor which exhibited anomalous electrical leakage in a time-based periodic study of nominal electrical characteristics following unbiased storage in a controlled environment. Physical analysis identified likely pre-existing self-repair sites and a high density of Ta2O5 crystalline oxide nodules as the likely causes of the observed anomalous electrical leakage.