Parametric Laser Mapping (PLM): A fault isolation solution for analog soft failure
Parametric Laser Mapping (PLM): A fault isolation solution for analog soft failure
Monday, October 5, 2026: 12:10 PM
Bridge Hall (Henry B. González Convention Center)
Summary:
Conventional Dynamic Laser Stimulation (DLS) techniques rely on binary pass/fail detection and single‑parameter analysis, which significantly limit sensitivity and robustness when applied to analog soft failures characterized by marginal behavior and parameter fluctuation. This paper introduces Parametric Laser Mapping (PLM), a boundary‑free laser‑based fault isolation methodology that continuously captures raw floating‑point parametric responses during laser scanning. By integrating automated test equipment with synchronized laser scanning microscopy, PLM enables simultaneous multi‑parameter acquisition within a single scan and generates parameter‑specific sensitivity heat maps that preserve critical analog information and enhance signal‑to‑noise ratio. Unlike conventional DLS, PLM eliminates the need for user‑defined pass/fail boundaries and operates under nominal test conditions, significantly reducing characterization effort while improving repeatability. Two challenging analog soft failure case studies—a Bluetooth transmitter synthesizer phase noise failure and an RF receiver LNA gain degradation—are presented to demonstrate the effectiveness of PLM. In both cases, PLM successfully localized subtle defects exhibiting parametric variations as small as 1–5%, which were not resolvable using conventional binary DLS techniques. Physical failure analysis confirmed strong spatial correlation between PLM‑identified hotspots and the underlying defects. The results establish PLM as a high‑sensitivity, efficient, and scalable fault isolation solution for complex analog and mixed‑signal integrated circuits.
Conventional Dynamic Laser Stimulation (DLS) techniques rely on binary pass/fail detection and single‑parameter analysis, which significantly limit sensitivity and robustness when applied to analog soft failures characterized by marginal behavior and parameter fluctuation. This paper introduces Parametric Laser Mapping (PLM), a boundary‑free laser‑based fault isolation methodology that continuously captures raw floating‑point parametric responses during laser scanning. By integrating automated test equipment with synchronized laser scanning microscopy, PLM enables simultaneous multi‑parameter acquisition within a single scan and generates parameter‑specific sensitivity heat maps that preserve critical analog information and enhance signal‑to‑noise ratio. Unlike conventional DLS, PLM eliminates the need for user‑defined pass/fail boundaries and operates under nominal test conditions, significantly reducing characterization effort while improving repeatability. Two challenging analog soft failure case studies—a Bluetooth transmitter synthesizer phase noise failure and an RF receiver LNA gain degradation—are presented to demonstrate the effectiveness of PLM. In both cases, PLM successfully localized subtle defects exhibiting parametric variations as small as 1–5%, which were not resolvable using conventional binary DLS techniques. Physical failure analysis confirmed strong spatial correlation between PLM‑identified hotspots and the underlying defects. The results establish PLM as a high‑sensitivity, efficient, and scalable fault isolation solution for complex analog and mixed‑signal integrated circuits.