Emerging FA Techniques and Concepts

Monday, October 5, 2026: 10:50 AM-12:30 PM
Mr. Kent Erington, Advanced Micro Devices, Inc. and Ms. Amrutha Sampath, NXP Semiconductors
10:50 AM
Extracting signals in crosstalk environments through Laser Perturbation Probing
Dr. Venkat Ravikumar, SIngapore University of Technology and Design; Mr. Winson Lua, Advanced Micro Devices - Singapore Pte Ltd; Mr. Kent Erington, Advanced Micro Devices, Inc.; Ms. Angeline phoa, Advanced Micro Devices - Singapore Pte Ltd; Mr. Kee Yang, Checkpoint Technologies
11:10 AM
RF IRLIT at the impedance sweet spot
Dr. Edwar Xie, Infineon Technologies AG
11:30 AM
Combined Current Density and Temperature Mapping using a Quantum Temperature Sensor
Dr. Gabriel Puebla Hellmann, QZabre AG; Mr. Björn Josteinsson, QZabre AG; Dr. Nele Harnack, QZabre AG; Mr. Simon Josephy, QZabre AG; Dr. Clemens Todt, QZabre AG; Dr. Andrea Morales, QZabre AG
11:50 AM
Stacked Die Product Debug at a Synchrotron
Mr. Robert Nesting, Intel; Joshua Freier, Intel; Kimberlee Celio, Intel Corporation
12:10 PM
Parametric Laser Mapping (PLM): A fault isolation solution for analog soft failure
Lee Xiang Gan, Qualcomm Global Trading Pte Ltd; Guofeng You, Qualcomm Global Trading Pte Ltd; Aldrin R. Limos, Qualcomm Global Trading Pte Ltd; Christan Lee, Qualcomm Global Trading Pte Ltd; Grace Tan, Qualcomm Global Trading Pte Ltd
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