Emerging FA Techniques and Concepts

Monday, October 5, 2026: 10:50 AM-12:30 PM
Bridge Hall (Henry B. González Convention Center)
Mr. Kent Erington, Advanced Micro Devices, Inc. and Ms. Amrutha Sampath, NXP Semiconductors
10:50 AM
Extracting signals in crosstalk environments through Laser Perturbation Probing
Dr. Venkat Ravikumar, SIngapore University of Technology and Design; Mr. Winson Lua, Advanced Micro Devices - Singapore Pte Ltd; Mr. Kent Erington, Advanced Micro Devices, Inc.; Ms. Angeline phoa, Advanced Micro Devices - Singapore Pte Ltd; Mr. Kee Yang, Checkpoint Technologies
11:10 AM
RF IRLIT at the impedance sweet spot
Dr. Edwar Xie, Infineon Technologies AG
11:30 AM
Stacked Die Product Debug at a Synchrotron
Mr. Robert Nesting, Intel; Joshua Freier, Intel; Kimberlee Celio, Intel Corporation; Mr. Evgeny Nisenboim, Intel Corp; Dan Bockelman, Intel; John Cherukuri, Intel; M H VanOrman, Intel; Timothy Lyon, Intel
11:50 AM
Parametric Laser Mapping (PLM): A fault isolation solution for analog soft failure
Mr. Lee Xiang Gan, Qualcomm Global Trading Pte Ltd; Dr. Guofeng You, Qualcomm Global Trading Pte Ltd; Mr. Aldrin R. Limos, Qualcomm Global Trading Pte Ltd; Ms. Grace Tan, Qualcomm Global Trading Pte Ltd
See more of: Technical Program
<< Previous Session | Next Session >>