Novel Applications of Nanoscale IR Spectroscopy Coupled with AFM for Semiconductor Failure Analysis

Tuesday, October 6, 2026: 4:40 PM
Dr. Cassandra Phillips , Bruker Nano, Santa Barbara, CA
Dr. Qichi Hu , Bruker Nano, Santa Barbara, CA
Dr. Chunzeng Li , Bruker Nano, Santa Barbara, CA
Dr. Hartmut Stadler , Bruker Nano Surfaces & Metrology, Santa Barbara, CA
Dr. Jinhee Kim , Bruker Nano, Santa Barbara, CA
Dr. Peter De Wolf , Bruker Nano Surfaces & Metrology, Santa Barbara, CA

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