Semi-automated FIB sample preparation techniques for TEM characterization of GaN-based power devices

Thursday, October 8, 2026: 11:40 AM
Dr. Jie Yang , TechInsights Inc., Ottawa, ON, Canada
Dr. Jonas Wagner , TechInsights Inc., Ottawa, ON, Canada
Dr. Lina Gunawan , TechInsights Inc., Ottawa, ON, Canada
Dr. Neerushana Jehanathan , TechInsights Inc., Ottawa, ON, Canada

See more of: FIB Sample Preparation & Circuit Edit
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