Thermal Management and Degradation Mechanisms in Heterogeneously Integrated Silicon Photonic Light Sources

Wednesday, October 7, 2026: 12:40 AM
Mr. Chin Wei Sher , Hon Hai Research Institute, Foxconn, Taipei, Taiwan, Taiwan
Mr. Yu Lin Huang , Hon Hai Research Institute, Foxconn, Taipei, Taiwan, Taiwan
Yu Lin Teng , Hon Hai Research Institute, Foxconn, Taipei, Taiwan, Taiwan
Jen-Shuo Liao , Hon Hai Research Institute, Foxconn, Taipei, Taiwan
Mr. Ta Yung Liu , Hon Hai Research Institute, Foxconn, Taipei, Taiwan
Hao Chung Kuo , Hon Hai Research Institute, Foxconn, Taipei, Taiwan
Ms. Chiu Pei Ju , Materials Analysis Technology Inc., Hsinchu, Taiwan, Taiwan
Mr. Yu Feng Ko , Materials Analysis Technology Inc., Hsinchu, Taiwan, Taiwan

Summary:

Integrated laser and silicon photonics are increasingly important for power consumption reduction, which can also reduce the space configuration. This study investigated the thermal performance and reliability of flip-chip integrated silicon photonic. High-resolution IR imaging recorded operating temperatures of 48.2°C for the driver and 42°C for the laser. Heat primarily accumulates in bump regions due to high current density and Intermetallic Compound (IMC) interface resistance. The missalgnment of the laser and waveguide were investrated by TEM and SEM, and to determine the packaging precision of the flip-chip process.
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