RF IRLIT at the impedance sweet spot
RF IRLIT at the impedance sweet spot
Monday, October 5, 2026: 11:10 AM
Summary:
This publication showcases a novel RF IRLIT localization flow including a pre-characterization step in the frequency domain. The key to this innovative technique lies in understanding how an open circuit affects the RF properties of the DUT, and using this knowledge to fine-tune the experimental setup to its optimum working point. At this impedance sweet spot, sensitivity and accuracy of the localization are maximized. We investigate the effectiveness of this approach by choosing a frequency range instead of a single frequency. In a frequency region close to the impedance sweet spot, more than a single open circuit can be uncovered precisely and non-destructively. Finally, a suggested analysis flow for open circuit DUTs is presented.
This publication showcases a novel RF IRLIT localization flow including a pre-characterization step in the frequency domain. The key to this innovative technique lies in understanding how an open circuit affects the RF properties of the DUT, and using this knowledge to fine-tune the experimental setup to its optimum working point. At this impedance sweet spot, sensitivity and accuracy of the localization are maximized. We investigate the effectiveness of this approach by choosing a frequency range instead of a single frequency. In a frequency region close to the impedance sweet spot, more than a single open circuit can be uncovered precisely and non-destructively. Finally, a suggested analysis flow for open circuit DUTs is presented.