Backside Delayering of Integrated Circuits for Digital Forensic Analysis: Challenges and Optimization
Wednesday, October 7, 2026: 8:20 PM
Mr. Tibbe van der Biezen
,
Netherlands Forensic Institution, Den Haag, Netherlands
Dr. Aya Fukami
,
Netherlands Forensic Institution, Den Haag, Netherlands
Mr. Kees Schot
,
Netherlands Forensic Institution, Den Haag, Netherlands
Dr. Aurelija Mockute
,
Swedish National Forensic Centre, Linköping, Sweden
Mr. Thomas Lindström
,
Swedish National Forensic Centre, Linköping, Sweden
Mr. Björn Ärleskog
,
Swedish National Forensic Centre, Linköping, Sweden
