Enabling High-Resolution AFM Analysis of Advanced Semiconductor Devices through Concentrated Argon Ion Beam Milling
Thursday, October 8, 2026: 10:40 AM
Dr. Cecile S. Bonifacio
,
EA Fischione Instruments, Export, PA
Dr. Richard Wei-chi Li
,
EA Fischione Instruments, Export, PA
Dr. Jason Killgore
,
National Institute of Standards and Technology, Boulder, CO
Jason Holm, PhD
,
National Institute of Standards and Technology, Boulder, CO
Dr. Kuo-Wei Huang
,
TSMC, Hsinchu, Hsinchu City, Taiwan
Rosalinda Ring
,
NenoVision s. r. o., Brno, Jihomoravsky kraj, Czech Republic
Ms. Mary Ray
,
EA Fischione Instruments, Export, PA
Mr. Paul Fischione
,
EA Fischione Instruments, Export, PA
