52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
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Localization of Gate Oxide Defects in Pool Capacitors in NAND-type 3D Flash memory
Wednesday, October 7, 2026: 5:20 PM
Mimi Dang
,
Sandisk Technologies Inc, Milpitas, CA
Xiaochen Zhu
,
Sandisk Technologies Inc, Milpitas, CA
Ngo Long
,
Sandisk Technologies Inc, Milpitas, CA
Phi Long
,
Sandisk Technologies Inc, Milpitas, CA
Elliott Rill
,
Sandisk Technologies Inc, Milpitas, CA
Lito De La Rama
,
Sandisk Technologies Inc, Milpitas, CA
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