Edge Detection for Automated Layer Thickness and Interface thickness Measurements of Transmission Electron Microscopy Images of Epitaxial AlxGa1-xN Multilayer Structures

Thursday, October 8, 2026: 8:00 AM
Dr. Zachary R Lingley , Infineon Technologies Austria AG, Villach, Karnten, Austria
Dr. Aidan Arthur Taylor , Infineon Technologies Austria AG, Villach, Carinthia, Austria
Inaki Lujambio , KAI Gmbh, Villach, Carinthia, Austria
Dr. Guillaume Gomme , Infineon Technologies Austria AG, Villach, Karnten, Austria

See more of: Microscopy Analysis and Material Characterization I
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