From Access to Insight An AI-Based End-to-End Failure Analysis Pipeline Combining Laser Sample Prep, Correlative Navigation, and Automated Image Analytics

Tuesday, October 6, 2026: 3:20 PM
Mohammad Taghi Mohammadi Anaei , UConn, Storrs, CT
Adrian Phoulady , UConn, storrs, CT
Matthew Maniscalco , UConn, Storrs, CT
Dr. Hongbin Choi , UConn, Storrs, CT
Parisa Mahyari , UConn, Storrs, CT
Dr. Nicholas May , Tescan, Storrs, CT
Dr. Sina Shahbazmohamadi , Tescan, Storrs, CT
Dr. Pouya Tavousi , Tescan, Storrs, CT

See more of: AI Applications for Failure Analysis III
See more of: Technical Program