Path Finder: Automated Connectivity Analysis for Multi‑Hotspot Failure Localization
Path Finder: Automated Connectivity Analysis for Multi‑Hotspot Failure Localization
Wednesday, October 7, 2026: 1:20 AM
Summary:
Photon emission microscopy (PEM) and thermal‑based emission analysis are widely used in semiconductor failure analysis (FA) for defect localization. A recurring challenge occurs when a single physical defect produces multiple emission hotspots, complicating electrical connectivity analysis and root‑cause identification. Conventional approaches often rely on manual layout tracing or limited hotspot‑to‑net mapping, which can be inefficient and unreliable when hotspots are separated by multiple logic stages or intermediate devices. This paper presents Path Finder, a netlist‑based automated connectivity analysis tool integrated within Synopsys Avalon. Path Finder traces logical and electrical connections between multiple hotspots by analyzing nets, cells, and intermediate devices directly from the design netlist. The resulting critical paths are clearly visualized in ISchemView and MaskView, enabling intuitive interpretation of hotspot relationships. By automating multi‑stage connectivity tracing, Path Finder reduces manual effort and improves the accuracy of electrical root‑cause identification. Customer use cases demonstrate its effectiveness in medium‑complexity failures, while highlighting limitations in deep scan‑chain and obfuscated netlist environments. Future enhancements are discussed.
Photon emission microscopy (PEM) and thermal‑based emission analysis are widely used in semiconductor failure analysis (FA) for defect localization. A recurring challenge occurs when a single physical defect produces multiple emission hotspots, complicating electrical connectivity analysis and root‑cause identification. Conventional approaches often rely on manual layout tracing or limited hotspot‑to‑net mapping, which can be inefficient and unreliable when hotspots are separated by multiple logic stages or intermediate devices. This paper presents Path Finder, a netlist‑based automated connectivity analysis tool integrated within Synopsys Avalon. Path Finder traces logical and electrical connections between multiple hotspots by analyzing nets, cells, and intermediate devices directly from the design netlist. The resulting critical paths are clearly visualized in ISchemView and MaskView, enabling intuitive interpretation of hotspot relationships. By automating multi‑stage connectivity tracing, Path Finder reduces manual effort and improves the accuracy of electrical root‑cause identification. Customer use cases demonstrate its effectiveness in medium‑complexity failures, while highlighting limitations in deep scan‑chain and obfuscated netlist environments. Future enhancements are discussed.