Few-shot Segmentation of Advanced 3D IC Structures Under Varying X-ray Acquisition Strategies

Tuesday, October 6, 2026: 10:30 AM
206 A-B (Henry B. González Convention Center)
Mr. Patrick Craig , University of Florida, Gainesville, FL
Mr. Pratyush Shukla , University of Florida, Gainesville, FL
Mr. Shajib Ghosh , University of Florida, Gainesville, FL
Ms. Antika Roy , University of Florida, Gainesville, FL
Jeff Gelb , Sigray Inc, Benicia, CA
Dr. Anasuya Adibhatla , Sigray Inc, Benicia, CA
Dr. Navid Asadi , University of Florida, Gainesville, FL

See more of: AI Applications for Failure Analysis I
See more of: Technical Program