Planar deprocessing of upper packaging layers in a logic chip using a plasma focused ion beam (PFIB) oxygen source and XeF2 gas assist
Planar deprocessing of upper packaging layers in a logic chip using a plasma focused ion beam (PFIB) oxygen source and XeF2 gas assist
Wednesday, October 7, 2026: 7:00 PM
Exhibit Hall (Henry B. González Convention Center)
