Dr. Jan Neuman

CEO
NenoVision s. r. o.
Brno, Jihomoravsky kraj
Czech Republic 61200

Papers:

Integrated PFIB Delayering and In-Situ AFM-Based Electrical Characterization for Rapid, Site-Specific 3D Failure Analysis of Advanced-Node Devices
Correlative In-Situ AFM-in-SEM technique for Advanced Semiconductor Failure Analysis and Material Characterization