52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026): https://www.asminternational.org/istfa-2026/

52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026

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Dr. Ashok Ranjan

STAFF ENGINEER
Micron
FA
Taoyuan, Taoyuan
Taiwan

Papers:

Low-Temperature CVD Oxide Deposition for Photoresist Protection
Multiscale Characterization of Hydrogen Plasma–Induced Defects in Semiconductor Materials
DRAM Capacitor-Redistribution Layer Overlay Measurement Using Image Processing with Dimple-Grinder Sample Preparation

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General Information

October 4 - 8, 2026


San Antonio, TX