Mr. Toby Chen

Principal failure analysis engineer
NXP Semiconductor
Failure Analysis
Kaohsiung City, Kaohsiung City
Taiwan 81170

Papers:

Localizing Fringe Capacitor Shorts in Advanced Nodes Using a VC Guided FIB Rule Out Methodology and PFIB Delayering
Bridging a Gap between Physical and Electrical Failure Analysis: Fault Localization on TEM Lamellae Enabled by Workflow Redesign and optional Probing Pads