Mr. Changsoo Lee

Product Engineer
Samsung Electronics
Hwaseong-si, Gyeonggi-do
Korea, Republic of (South) 18448

Papers:

Analytical Approach for Revealing Latent Intermittent Column Failures Associated with Bit-Line Sense Amplifier Vulnerability in DRAM
Study on Characteristic Degradation Induced by Unused Dummy Patterns in Open Bitline DRAM