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Lock-In Infrared Thermography for IC Failure Analysis

Sunday, November 11, 2012: 5:00 PM
101B (Phoenix Convention Center)
Dr. Otwin Breitenstein , Max Planck Institute of Microstructure Physics, Halle, Germany
Mr. Christian Schmidt , Fraunhofer Institute for Mechanics of Materials, Halle, Germany
See more of: Fault Localization
See more of: Tutorial