Start | At-A-Glance | Browse by Day | Author Index

Fault Localization

Sunday, November 11, 2012: 12:00 PM-6:00 PM
101B (Phoenix Convention Center)
Session Chairs:
Ms. Susan Li and Dr. Lihong Cao
12:00 PM
Beam-Based Defect Localization
Dr. Edward I. Cole Jr., Sandia National Laboratories
1:00 PM
Photonic Localization Techniques
Dr. Arkadiusz Glowacki, Berlin University of Technology; Prof. Christian Boit, Berlin University of Technology
2:00 PM
Laser Induced Techniques for Microelectronic Failure Analysis: SDL and LADA
Dr. Michael Bruce, Consultant
3:00 PM
Magnetic Current Imaging
Mr. David Vallett, IBM Systems and Technology Group
4:00 PM
Failure Localization with active and passive Voltage Contrast in FIB and SEM
Dr. Ruediger Rosenkranz, Fraunhofer Institute for Non-Destructive Testing
5:00 PM
Lock-In Infrared Thermography for IC Failure Analysis
Dr. Otwin Breitenstein, Max Planck Institute of Microstructure Physics; Mr. Christian Schmidt, Fraunhofer Institute for Mechanics of Materials
See more of: Tutorial
<< Previous Session | Next Session >>