38th International Symposium for Testing and Failure Analysis: Tutorial

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Package and Physical Analysis Challenges I
Session Chair: Mr. Ed Keyes and Mr. Christopher A. Pawlowicz

Electrical and Yield
Session Chair: Mr. Mark Jenkins

Microscopy I
Session Chair: Dr. Sam Subramanian and Mr. Randal E. Mulder

Fault Localization
Session Chair: Ms. Susan Li and Dr. Lihong Cao

Technology Specific FA
Session Chair: Mr. Jeremy A. Walraven and Mr. Mark Jenkins

Package and Physical Analysis Challenges II
Session Chair: Mr. Ed Keyes and Mr. Christopher A. Pawlowicz