Microscopy I

Sunday, November 11, 2012: 10:00 AM-3:00 PM

102C (Phoenix Convention Center)

Session Chairs:

Dr. Sam Subramanian and Mr. Randal E. Mulder

10:00 AM

Scanning Electron Microscopy Basics
Dr. William E. Vanderlinde, Laboratory for Physical Sciences

11:00 AM

The Role of the AFM in Yield and FA
Mr. Jim Colvin, FA Instruments

12:00 PM

Ultra-High Resolution in the SEM
Dr. William E. Vanderlinde, Laboratory for Physical Sciences

1:00 PM

Lunch

2:00 PM

Materials Microanalysis for Failure Analysis
Dr. William E. Vanderlinde, Laboratory for Physical Sciences

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