39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)

November 03 - 07, 2013

Dr. M.K. Dawood

Senior Engineer
Globalfoundries Singapore Pte. Ltd.
Technology Development-New Technology Prototyping
Globalfoundries Singapore Pte. Ltd., 60 Woodlands Industrial Park D Street 2,
Singapore 738406.
Singapore Singapore 738406

Papers:
10.7 Study of Static Noise Margin and Circuit Analysis On Advanced Technology Node SRAM Devices By Nanoprobing 13.1 Application of Laser Deprocessing Techniques in Physical Failure Analysis 13.2 Cross Sectional Focus Ion Beam Top-Down Delayering