FIB User Group

Wednesday, November 6, 2013: 4:45 PM-6:45 PM
Meeting Room 230A (San Jose McEnery Convention Center)
4:45 PM
FIB at Glancing Angle of Incidence, Valery Ray, PBS&T
5:10 PM
Atom Probe Creation Using FIB-SEM, Nicholas Antoniou, Harvard University
5:35 PM
Advances in Site-Specific In-Situ TEM Sample Preparation Advances in Site-Specific In-Situ TEM Sample Preparation, Brandon Van Leer, FEI Company
6:00 PM
Comparison Between ex situ and in situ Lift Out Techniques, Lucille Giannuzzi, L.A. Giannuzzi & Associates LLC
6:25 PM
Comparison of the Manipulator Based and Shuttle Based Lift Out Technique, Stephan Kleindiek, Kleindiek Nanotechnik GmbH
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