40th International Symposium for Testing and Failure Analysis (ISTFA 2014): Metal Bridge Defects Localization By a Tiny Leakage Between One of Bridged Signals and VDD (GND)

Metal Bridge Defects Localization By a Tiny Leakage Between One of Bridged Signals and VDD (GND)

Wednesday, November 12, 2014

Exhibit Hall B3 (George R. Brown Convention Center )

Mr. Chunlei Wu , Freescale Semiconductor (China) Limited, Tianjin, China

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