Evaluation of Power SiC-MOSFET Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy: Imaging of Carrier Distribution and Depletion Layer

Wednesday, November 12, 2014: 4:20 PM
310 B (George R. Brown Convention Center )
Mr. Norimichi Chinone , Tohoku University, Sendai, Japan
Dr. Takashi Nakamura , ROHM Co., Ltd., Kyoto, Japan
Prof. Yasuo Cho , Tohoku University, Sendai, Japan

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