3D IC/Stacked Device Fault Isolation Using 3D Magnetic Field Imaging

Monday, November 10, 2014: 1:00 PM

310 A (George R. Brown Convention Center )

Dr. Antonio Orozco , Neocera, Beltsville, MD

Mr. Nicolas Gagliolo , Neocera, Beltsville, MD

Mr. Christopher Rowlett , Neocera LLC, Beltsville, MD

Mr. Enoch Wong , Neocera, Beltsville, MD

Mr. Anurag Moghe , Neocera, Beltsville, MD

Mr. Steve Garrahan , Neocera, Beltsville, MD

Mr. Jan Gaudestad , Neocera, LLC, Beltsville, MD

Mr. Alex Jeffers , Center for Nanophysics and Advanced Materials, College Park, MD

Mr. Keyvan Torkashvan , Center for Nanophysics and Advanced Materials, College Park, MD

Dr. Frederick C. Wellstood , Center for Nanophysics and Advanced Materials, College Park, MD

Dr. A. B. Cawthorne , Trevecca Nazarene University, Nashville, TN

Dr. Fulvio Infante , Intraspec Technologies, Toulouse, France

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