Near-Field Scanning Optical Microscopy for Through-Silicon Imaging and Fault Isolation of Integrated Circuits

Wednesday, November 12, 2014: 5:35 PM
310 B (George R. Brown Convention Center )
Dr. Rajiv Giridharagopal , Intel Corp., Hillsboro, OR
Dr. Travis M. Eiles , Intel Corp., Hillsboro, OR
Dr. Baohua Niu , Intel Corp., Hillsboro, OR

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