Site-Specific, Wide Field-of-View Cross-Sectional Sample Preparation, Imaging and Analysis in a Plasma Ion Source Microscope

Wednesday, November 12, 2014: 4:20 PM
310 A (George R. Brown Convention Center )
Mr. Roger Alvis , FEI Company, Hillsboro, OR
Mr. Ron Kelley , FEI Company, Hillsboro, OR

See more of: Sample Preparation and Device Deprocessing I
See more of: Symposium