A Case Study on the Benefits of Functional Memory Access During ATE Test and Electrical Fault Isolation Techniques for Embedded SRAM
A Case Study on the Benefits of Functional Memory Access During ATE Test and Electrical Fault Isolation Techniques for Embedded SRAM
Thursday, November 13, 2014: 2:55 PM
310 B (George R. Brown Convention Center )
Summary:
A novel technique for electrically isolating faults on the ports of embedded SRAM is introduced. The techniques developed are utilized to successfully isolate defects and culminate in successful PFA on several units
A novel technique for electrically isolating faults on the ports of embedded SRAM is introduced. The techniques developed are utilized to successfully isolate defects and culminate in successful PFA on several units