Software-Based Techniques, Test, Diagnosis, and Yield

Thursday, November 13, 2014: 2:30 PM-3:45 PM
310 B (George R. Brown Convention Center )
Session Chairs:
Mr. Geir Eide and Mr. Mark E. Kimball
2:30 PM
Design Debug for Intermittent Power up Failure in Analog/Mixed Signal Device
Mr. Sagar Karki, Texas Instruments Corporation
2:55 PM
A Case Study on the Benefits of Functional Memory Access During ATE Test and Electrical Fault Isolation Techniques for Embedded SRAM
Mr. Corey Goodrich, Texas Instruments
3:20 PM
Introduction to Verification and Test Using a 4-bit Arithmetic Logic Unit Including a Failure Module in a Xilinx XC9572XL CPLD
Dr. Martin Versen, University of Applied Sciences Rosenheim; Mr. Michael Hayn, University of Applied Sciences Rosenheim
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