Case Studies on Application of 3D Real Time X-ray for Flip Chip C4 Package

Tuesday, November 11, 2014: 11:10 AM
310 A (George R. Brown Convention Center )
Dr. Lihong Cao , Advanced Micro Devices, Austin, TX

Summary:

This article describes how 3D Real Time X-Ray (RTX) technique enhances the capability of package-level failure analysis of a flip-chip package. 3D RTX was successful in detecting different failure signatures. This paper outlined detailed application of 3D RTX with the case studies.
See more of: Packaging and Assembly Analysis II
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