Focused Ion Beam (FIB) for Circuit Edit, Fault Isolation and Sample Preparation

Sunday, November 9, 2014: 4:30 PM
310 A (George R. Brown Convention Center )
Mr. Steven B. Herschbein , IBM Systems & Technology, Hopewell Junction, NY
Mr. Oleg Sidorov , FEI Company, Hillsboro, OR
Mr. Chris Scheffler , Intel Corporation, Santa Clara, CA
Mr. Richard Livengood , Intel Corporation, Santa Clara, CA
Dr. Shida Tan , Intel Corporation, Santa Clara, CA

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