Focused Ion Beam (FIB) for Circuit Edit, Fault Isolation and Sample Preparation Tutorial

Nail, Carl

Focused Ion Beam (FIB) for Circuit Edit, Fault Isolation and Sample Preparation Tutorial

Sunday, November 9, 2014: 4:30 PM-5:30 PM

310 A (George R. Brown Convention Center )

Session Chairs:

Mr. Carl Nail and Ms. Rose Ring

4:30 PM

Focused Ion Beam (FIB) for Circuit Edit, Fault Isolation and Sample Preparation
Mr. Steven B. Herschbein, IBM Systems & Technology; Mr. Oleg Sidorov, FEI Company; Mr. Chris Scheffler, Intel Corporation; Mr. Richard Livengood, Intel Corporation; Dr. Shida Tan, Intel Corporation

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