40th International Symposium for Testing and Failure Analysis (ISTFA 2014): http://www.asminternational.org/content/Events/istfa/

40th International Symposium for Testing and Failure Analysis (ISTFA 2014)
November 09 - 13, 2014

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Mr. Jan Gaudestad

Global Sales and Applications Manager
Neocera, LLC
Magnetic Field Imaging
10000 Virginia Manor Rd
Suite 300
Beltsville, MD
USA 20705

Papers:
3D IC/Stacked Device Fault Isolation Using 3D Magnetic Field Imaging Failure Analysis Work Flow for Electrical Shorts in Triple Stacked 3D TSV Daisy Chains Short Localization in 2.5D Microchip with Interposer using Magnetic Current Imaging High-Resolution Backside GMR Magnetic Current Imaging on a Contour-Milled Globally Ultrathin Die

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General Information

November 09 - 13, 2014


Houston, TX