40th International Symposium for Testing and Failure Analysis (ISTFA 2014): http://www.asminternational.org/content/Events/istfa/

40th International Symposium for Testing and Failure Analysis (ISTFA 2014)
November 09 - 13, 2014

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Dr. Sam Subramanian

Senior Member of Technical Staff
Freescale Semiconductor, Inc.
6501 William Cannon Drive West
Austin, TX
USA 78735

Papers:
Advanced Failure Analysis on Silicon Pipeline Defects and Dislocations in Automotive Mixed-Mode Devices Cross-Section Sample Preparation Method for Imaging Dopant Related Anomalies Using Scanning Probe Microscopy Techniques Transmission Electron Microscopy

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General Information

November 09 - 13, 2014


Houston, TX