Dr. Michael DiBattista

Staff Engineer
Qualcomm Technologies, Inc.
5751 PACIFIC CENTER BLVD
BUILDING W-115N
San Diego, CA
USA 92121

Papers:
Application of Passive Voltage Contrast (PVC) to DualBeam Focused Ion Beam (FIB) Based Sample Preparation for the Scanning/Transmission Electron Microscope (S/TEM) Using Energy Dispersive Spectroscopy (EDS) to Determine the Resistance of FIB Jumpers for Circuit Edit