Ms. May Yang
Ms. May Yang
Semiconductor Manufacturing International (Beijing) Corp
Analysis Lab
18 Wenchang Avenue
Beijing
China
100176
Papers:
Basic Decapsulate Tool Function Develop for Cu Wire Bonding IC and the Real Usage on Function Extended Basic EMMI for Dynamic EFA
Identification Failure Mechanism of Threshold Voltage Shift Induced By Dopant Diffuse Via Nano-Probe, Simulation and Wet Stain Techniques