Mr. Dayanand Nagalingam

Senior Engineer
GLOBALFOUNDRIES Singapore Pte Ltd
Product, Test and Failure Analysis
60 Woodlands Industrial Park D Street 2, Singapore 738406
Singapore Singapore 738406

Papers:
Applications of AFP Nanoprobing for Localization of Implant Related Issues Utilizing Nanoprobing and Circuit Diagnostics to Identify Key Failure Mechanism of Otherwise Non-Visible Defects in 20nm Logic Devices