Dr. Andrea Bahgat Shehata

IBM T.J. Watson Research Center
Circuit Test and Diagnostics Technology
1101 Kitchawan Road
P.O. Box 218
Yorktown Heights, NY
USA 10598

Papers:
Novel NIR Camera with Extended Sensitivity and Low Noise for Photon Emission Microscopy of VLSI Circuits Ultra-Low Voltage TRE Measurements from 32 nm SOI CMOS Integrated Circuits